Sessions will cover the following:

Abstracts: Dearborn, MI - September 25, 2007

Characterize EMI Lab RF Cables, Connectors, and Accessories Using eBay and a Test Receiver

Presenter: Lee Hill, SILENT

Many EMC engineers and technicians have and are familiar with using a spectrum analyzer with tracking generator. This presentation gives a hands-on demonstration of how to create a very sensitive, low cost measurement system for characterizing the performance of RF devices found in most EMC troubleshooting and test laboratories. This setup can be used to do nice “sanity checks” of RF equipment. We will use a portable test receiver/spectrum analyzer and tracking generator, together with a dual directional coupler purchased on ebay to demonstrate the usefulness of S11 “return loss” or “reflection loss” measurements. First, the principles of “through” or “insertion loss” measurements will be discussed and demonstrated. Second, the principles of return loss measurements will be discussed and demonstrated. A variety of common EMC test/debug laboratory RF devices such as RF series adapters, attenuators, probes, and antennas will be characterized with one or both of the two measurements. The main emphasis of the presentation will be a 50 ohm return loss measurement setup with a best case dynamic range of 40 dB. The characterization is done in the frequency domain to provide insight into the useful frequency range of a particular device. There will be a short tutorial on the advantages, disadvantages, and best use of insertion loss and return loss measurements.

EMI Measurements Using Time Domain (FFT) Based Test Instruments

Presenter: Vic Hudson, Rohde & Schwarz

This presentation will discuss EMI measurement systems with a focus on comparing and contrasting time domain/FFT and frequency domain based instruments. The pros and cons of each method including comparisons of timing, accuracy and the usability of the results each method produces will be addressed. The often asked questions, “Can FFT yield compliant measurements?” and “What are the considerations when using the statistical approximations of the quasi-peak and average detectors in FFT based systems?” will also be discussed.

Full Vehicle Testing: Making CISPR 12 and ISO 11451 Measurements in a Single Chamber

Presenter: Dr. Vicente Rodriguez, ETS-Lindgren

This presentation will begin with a discussion of CISPR 12 and ISO 11452 radiated emissions test requirements. A case study will then be presented describing how a single chamber was designed to meet the test requirements for both CISPR 12 whole vehicle testing, and ISO 11452 component testing.

Tech Tour Speakers include:

Lee Hill is an electromagnetic compatibility (EMC) engineer with over twenty years of industry experience in the design and retrofit of complex electronic systems. He is Founding Partner of SILENT, an independent consulting firm that specializes in EMC and RF design, troubleshooting and training. SILENT provides services to commercial and industrial manufacturers with global distribution including the consumer, computer, network and telecommunications, industrial, medical, scientific and automotive industries.

Dr. Vicente Rodríguez-Pereyra is an RF and Electromagnetics engineer with ETS-Lindgren. He serves as the Senior Principal Antenna Design Engineer in charge of the development of new antennas and improving the existing antenna line. Vince’s interests are Numerical Methods in Electromagnetics, especially when applied to antenna design and analysis. He is the author of more than twenty publications including journal and conference papers as well as book chapters. He also holds patents for hybrid absorber design and for a new dual ridge horn antenna design for EMC applications.

Vic Hudson has worked at Rohde & Schwarz as a Project Manager for seven years. He has been involved in EMC for nearly 12 years. Vic’s background includes application support, software development, system design, and equipment sales. Vic graduated with a BSEE from Southern Illinois University-Carbondale in 1985.

Acknowledgement

The SE Michigan EMC Chapter is grateful for the support provided by Rohde & Schwarz, ETS-Lindgren, and Conformity Magazine for providing the technical experts, equipment to support the demonstrations, and for funding the printing of the program and catering during the seminar. Also, many thanks to Kimball Williams for lending his time and expertise to the technical program.   Last, but not least, our gratitude goes to the University of Michigan at Dearborn for providing the excellent conference facilities and for establishing an undergraduate course in EMC complemented by an on campus EMC laboratory.

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