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Advance Program

On July 18, 2006 The Southeastern Michigan IEEE EMC Society Chapter

 Proudly Presents

TECH TOUR:  The Latest in Automotive EMC Test Techniques and Test Laboratory Verification/Correlation

A FREE Educational Seminar Featuring Industry Renowned Speakers:

Vince Rodriguez, ETS-Lindgren

James Young, Rohde & Schwarz

Hans Peter Bauer, Rohde & Schwarz

Kimball Williams, Denso America

In addition, a Panel of Automotive EMC Experts will follow the presentations for audience interaction.  The panel will also review Verification & Correlation requirements for AEMCLAP.

Panel participants include Keith Frazier (Ford),

Terry North (DaimlerChrysler), and Larry Banansky (GM).

 

This FREE half-day course will consist of a three part technical seminar. The goal of the seminar presentations is to provide practical information for the EMC engineer, designer or technician to actually use on the job! Following the technical seminar, a reception with the speakers will be held. Demonstrations of the material presented will be conducted. Participants can informally meet with the speakers and view these hands on demonstrations that are designed to "drive home" the material presented. Heavy appetizers and refreshments will be served. A raffle will be held at the conclusion of the reception. Sponsored by the SE Michigan EMC Chapter, these door prizes are sure to be a winner! Drop your business card in the bowl on the registration desk and enter to win the raffle. You must be present to win, of course!

July 18, 2006

Event Registration Link

Featuring industry renowned speakers:


Vince Rodriguez, ETS-Lindgren

 


 
James Young, Rohde & Schwarz

 


Hans-Peter Bauer

 


Kimball Williams, Denso

 

This is a FREE event Sponsored by ETS-Lindgren, Rohde & Schwarz, U of M Dearborn and the Southeastern Michigan Chapter of the IEEE Electromagnetic Compatibility (EMC) Society.

Location:

Fairlane Campus - U of M Dearborn

(Map Code FCN)

University of Michigan
School of Management
Fairlane Center North - Room Quad E
19000 Hubbard Drive
Dearborn, MI 48126

Driving Directions
 

Speaker information:

Vicente Rodríguez-Pereyra attended the University of Mississippi where he obtained his B.S.E.E. in 1994 and his M.S. and Ph.D. in Engineering Science with an emphasis on Electromagnetic Theory in 1996 and 1999, respectively. In August 1999, Dr. Rodríguez joined the faculty of the department of Electrical Engineering and Computer Science at Texas A&M University-Kingsville. In June 2000, Dr. Rodríguez joined EMC Test Systems (now ETS-Lindgren) as an RF and Electromagnetics engineer. During this time he was involved primarily in anechoic chamber design. In September 2004, Dr. Rodríguez took over the position of Senior Principal Antenna Design Engineer, placing him in charge of the development of new antennas and of improving the existing antenna line.  Dr. Rodríguez’s interests are Numerical Methods in Electromagnetics, especially when applied to antenna design and analysis. Dr. Rodríguez is the author of more than twenty publications including journal and conference papers as well as book chapters. Dr. Rodriguez holds patents for hybrid absorber design and for a new dual ridge horn antenna design for EMC applications. Dr. Rodríguez is a member of the IEEE and several of its technical societies. He is an active member of the Applied Computational Electromagnetic Society (ACES). Dr. Rodriguez has served as a reviewer for the ACES Journal and for the Journal of Electromagnetic Waves and Applications. He has co-chaired sessions during the 2003 and 2006 ACES symposia and workshops as well as during the 2002 and 2004 IEEE EMC annual symposia. Dr. Rodríguez is a Full member of the Sigma Xi Scientific Research Society and of the Eta Kappa Nu Honor Society.

James Young is the sales and marketing manager for Rohde & Schwarz EMI products in the Americas. His engineering background includes system, circuit, ASIC and FPGA design for various communication products. He has also held product management and marketing positions with Cadence (Tality) in San Jose, CA, ParkerVision in Jacksonville FL, and Signal Space Design in Salt Lake City, UT. He holds a BSEET from Weber State University and an MBA from the University of Phoenix.

Hans-Peter Bauer is a senior project manager for EMC and RF test systems at Rohde & Schwarz. He has more than 12 years of experience in EMC test systems for commercial, automotive, and military applications. He received his electrical engineering degree with emphasis on RF and antenna theory (Dipl.-Ing.) from the Fachhochschule in Mannheim, Germany in 1992.

Kimball Williams is a Senior Manager with Denso Americas in Southfield, Michigan, USA where he is the technical lead for the EMC test laboratory.  He holds a BSEE degree from Lawrence Technological University in Southfield, Michigan.  His professional experience includes the following: 
Principal EMC Engineer for Eaton Corporation for 26 years, Principal Designated Engineer for Underwriters Laboratories for 3 years, Member of the IEEE EMC Society Board of Directors and past President , Member of the IEEE EMC Society Standards Committee, Secretary of the South Eastern Michigan Chapter of the IEEE EMC-S, National Association of Radio and Telecommunications Engineers (NARTE) certified EMC & ESD engineer and a member of the Board of Directors for NARTE, Past Member of the SAE EMI and EMR Technical Committees, Past Member of the US Technical Advisory Groups to CISPR/D and ISO/TC22.  He holds one patent in the field of electro-technology, and is an amateur radio operator (N8FNC), scuba diver and private pilot. 

 

July 18, 2006 Schedule

12:30

 

REGISTRATION

1:00

 

Welcome by Dr. Shridhar, Chair of the Electrical and Computer Engineering Departments - U of M Dearborn

1:05

1

GTEM Testing Methodology for ICs by Vince Rodriguez, ETS-Lindgren
     2:00  

REFRESHMENT BREAK

2:15

2

CISPR 25 Testing Using Time Domain (FFT) Based Test Instruments, by James Young, Rohde & Schwarz

3:00

 

REFRESHMENT BREAK

3:15 3 600 Volt per Meter Reverb Systems; Real World Experiences and Test Data, by Hans-Peter Bauer, Rohde & Schwarz

3:45

 

 REFRESHMENT BREAK

4:00
4
Presentation in Two Parts:  “Verification Testing for the EMC Laboratory” and “Announcement of the IEEE SE Michigan EMC Chapter Inter Laboratory Correlation Task Force.”  Kimball Williams, Denso America

5:00

 

STRETCH BREAK

5:05
  Panel Discussion:  Includes Above Speakers on Test Techniques as well as Keith Frazier (Ford), Terry North (DCX), Larry Banansky (GM) on Verification & Correlation requirements for AEMCLAP.

5:30

 

Reception with heavy appetizers and refreshments

6:30

 

Door Prizes, End

 

Bookmark this page and check back here again for updates.

 

Note: The scheduled times and order of speakers may be subject to change without advance notice.

The Program

Sessions will cover the following:

GTEM Testing Methodology for ICs by Vince Rodriguez, ETS-Lindgren

                        Abstract:    As integrated circuits (ICs) become increasingly pervasive in all industries, especially automotive, emissions from ICs and their effect on the overall product performance become increasingly significant.  For example, vehicles today have much more processing power than used in the past on board the space vehicle Apollo, which put a man on the moon!  ICs, switches, transducers, sensors, motors and interfaces all operate today in a very harsh and confined environment, particularly in the automotive environment.  Their impact on overall vehicle performance cannot be overestimated, especially as faster ICs have pushed the upper emission limits above the 1 GHz mark, in such standards as SAE 1752-3.   This presentation will outline new ways to effectively perform EM testing of ICs that are time efficient, repeatable, accurate, and cost effective using GTEM testing methodology. 

CISPR 25 Testing Using Time Domain (FFT) Based Test Instruments, by James Young, Rohde & Schwarz

Abstract:  This session will discuss EMI measurement systems with a focus on comparing and contrasting time domain/FFT based instruments and frequency domain instruments.  Discussions centering the pros and cons of each method, timing comparisons, accuracy comparisons and overall usability of the results will be addressed.  The burning question: “Can an FFT yield compliant measurements?” will be discussed, as will be “What are the considerations when using the statistical approximations of the quasi-peak and average detectors in FFT based systems?” 

600 Volt per Meter Reverb Systems; Real World Experiences and Test Data, by Hans-Peter Bauer, Rohde & Schwarz

 Abstract:  This session will review four recent reverberation immunity system installations that achieved 600 volt per meter field strengths.  It is well known that RF power amplifiers used in immunity systems make up the bulk of the price of the system, and that the price of the amplifiers is directly proportional to required output power.  As a result, component suppliers and testing facilities benefit from having an accurate representation of the power requirements necessary to achieve a 600 V/m field under real world conditions.  Actual test data will be shown which display the achievement of the required GMW and Ford field strength and the power required to attain it given paddle positions, size of the chamber, and different loading configurations

 
The IEEE EMC Chapter inter laboratory correlation Task Force & Verification Testing for the EMC Laboratory.  Kimball Williams, Denso

EMC Chapter Inter Laboratory Correlation Task Force.”  Recent emphasis on verification testing within the automotive EMC community, and in particular among the A2LA accredited AEMCLAP laboratories, has generated the need to discuss this topic in an open forum.   

Abstract:  Verification Testing for the EMC Laboratory - The EMC laboratory, its ISO 17025 requirements and methods: ISO 17025 requirements for verification and inter laboratory correlation pose two related, yet different, tasks on the EMC laboratory.  Each has its place in ensuring the laboratory’s continued skills and data accuracy.  Verification testing serves two fundamental functions: First, it ensures a periodic function of the test equipment and procedures, and in turn ensures that skills that might become weak are maintained at least to a minimum level.  The second is to serve as a check on the data gathered using the particular test method.  Comparisons between earlier data sets and the most recent can be used to determine the long term, historical stability of the test system, and of the training of its operators.  We will discuss both functions in some detail, and provide examples of methods of ensuring both the near term repeatability as well as long-term historical records.  A template for the minimum required verification testing schedule will be suggested along with three methods of satisfying the requirement.  Correlation testing between cooperating laboratories will be discussed with the intention of defining the purpose, benefits, costs and rewards of this approach to test method verification.  We will also engage in an internal debate on both the risks and rewards to be encountered in such ‘open’ programs of inter laboratory cooperation.  Several options for building a network of such laboratories, and possible alternatives will be explored, compared, and contrasted. 

 Abstract:  The New Local IEEE EMC Chapter Inter Laboratory Correlation Task Force:  A growing need was perceived within the EMC community by the officers of Southeastern Michigan Section Chapter VIII (EMC) for a method to facilitate the gathering and ‘safe’ distributions of inter laboratory comparison test data.  Engineers at Yazaki were instrumental in devising a prototype minimum-maintenance system and promoting its use within the local EMC community.  In order to expand this system’s use, the Chapter organized a sub-element within its structure as a Round Robin Task Force designed to lead the Chapter in the development of appropriate systems to extend this system to all of the most common tests and coordinate among a larger number of EMC laboratories.  Topics covered will include: Information exchange, Round Robin testing, control of the test artifacts, development of ‘common’ test methods, test method tutorials and workshops for education and training at the Chapter level.  In addition, we will lay the groundwork for inter laboratory mutual self-help. 

 

Event Registration Link

No registrations at the door.  Deadline:  July 13.

 

You must complete this registration form on line by July 13, 2006 in order to secure your seat at this seminar. No registrations will be accepted at the door.  There is no charge to attend this seminar, but a completed registration form must be on file in order to be admitted to the seminar. Seating is limited; seating will be reserved on a first come, first served basis. NOTE: The speakers and program may be subject to change without prior notice.

 

Committee

Committee Co-Chair
Kimball Williams
Denso International America Inc
248-372-8074
  kimball@emcsociety.org

Committee Co-Chair
Dr. M. Shridhar
University of Michigan - Dearborn


Proceedings & Arrangements
Janet O'Neil
ETS-Lindgren
425-868-2558
janet@emcsociety.org

Registrations & Website
Scott Lytle
Yazaki North America
6800 N. Haggerty Road
Canton, Michigan 48187
734-983-6012, fax 734-983-6013
s
cott@emcsociety.org

Treasurer
Matt Feusse
Yazaki North America
6800 N. Haggerty Road
Canton, Michigan 48187
734-983-6004, fax 734-983-6005
matt@emcsociety.org

Committee Member
Candace Suriano, PhD.
Suriano Solutions
248-852-4323
candace@emcsociety.org

 

 

This is a FREE event Sponsored by ETS-Lindgren, Rohde & Schwarz, U of M Dearborn and the Southeastern Michigan Chapter of the IEEE Electromagnetic Compatibility (EMC) Society.

Acknowledgement

The SE Michigan EMC Chapter is grateful for the support provided by Rohde & Schwarz, ETS-Lindgren, and Conformity Magazine for providing the technical experts, equipment to support the demonstrations, and for funding the printing of the program and catering during the seminar. Also, many thanks to Kimball Williams for lending his time and expertise to the technical program.   Last, but not least, our gratitude goes to the University of Michigan at Dearborn for providing the excellent conference facilities and for establishing an undergraduate course in EMC complemented by an on campus EMC laboratory.

 

http://www.emcsociety.org

Webmaster:  Scott@emcsociety.org