The Southeastern Michigan IEEE EMC Society Presents in conjunction with Rohde and Schwarz:

A message from Rhode & Schwarz
     
 

Presentation Invitation:
Technical Presentation on Modern Concepts in Electromagnetic Immunity Testing

Presented by Rohde & Schwarz
April 24 | Canton, MI


EMC32

 
DATE: Tuesday, April 24, 2012
LOCATION: Rohde & Schwarz Mobile Training Facility
Yazaki Testing Center

6800 N. Haggerty Road
Canton, MI 48187
TIME:

8:00am – 10:00am or 11:00am – 1:00pm

WHO SHOULD ATTEND? EMI Technicians, EMI Engineers, and Product Development Engineers

Seating is limited. Register now!

If you'd like to attend the 8:00am presentation, please click the following register button below.

Register for this event here! 
If you'd like to attend the 11:00am presentation, please click the following register button below.

Register for this event here!
 
 


Topic to be Covered

This technical seminar will discuss several concepts that are central to modern immunity testing. Topics include:
– Overview of EUT monitoring using the popular R&S™EMC32 software. This will include a discussion on using COM and LAN port devices to monitor equipment under test.
– Fundamentals of selecting power amplifiers to support immunity testing.
– Generating test signals for use during immunity testing. Specific focus will be placed on the importance of minimizing level switching transients along with modern advances in simulating radar signals.


 
  Learning Objectives

 
 

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Understand a range of automated techniques for monitoring EUT using R&S™EMC32 software
Learn the fundamentals of selecting power amplifiers for generating immunity fields
Understand the importance of minimizing level switching transients during immunity tests
See new techniques for generating pulse sequences that simulate radar signals

     

 

For more information on R&S™ and our products & solutions please visit www.rohde-schwarz.com