EMI Measurements using Time Domain (FFT) based test instruments
IEEE Southeastern Michigan: Chapter VIII (EMC)
Pizza Sponsor: Rohde & Schwarz
Building: U of M Dearborn
Room Number: Posted on Video Monitors Room 126
Fairlane Center North
19000 Hubbard Drive
United States 48124
Click here for Map
Time: 05:30PM to 08:30PM (3.00 hours) All times are: US/Michigan
No Admission Charge.
James Young of Rohde & Schwarz
Topic: EMI Measurements using Time Domain (FFT) based test instruments
This session will discuss EMI measurement systems with a focus on comparing and contrasting time domain/FFT based instruments and frequency domain instruments. Discussions around the CISPR committee approach to FFT based testing and how it may impact CISPR-25 type testing in the future will also be covered. Some pros and cons of each method, timing comparisons, accuracy comparisons and overall usability of the results will be addressed. The session will also discuss the Rohde & Schwarz claim of vast speed improvements over previous approaches to EMI tests using this method.
Biography: James Young works as an RF
applications engineer and subject matter expert in EMC test and measurement for
Rohde & Schwarz. Over the nearly 12 years with Rohde & Schwarz he has
had several assignments and positions centered on EMC including product
management of the EMC instruments and systems, system design and project
management. He has also focused on measurements and performance analysis of LTE,
WCDMA and CDMA devices and networks.
His engineering background includes system, circuit, ASIC and FPGA design for various communication products. He has also held product management and marketing positions with Cadence (Tality) in San Jose CA, ParkerVision in Jacksonville FL, and Signal Space Design in Salt Lake City, UT. He holds a BSEET from Weber State University and an MBA from the University of Phoenix.
Address: Texas, United States
5:30 Pizza and Refreshments
6:00 Technical Presentation
7:30 Questions and answers