Meeting Notice

The Southeastern Michigan IEEE EMC Society presents:

ESD/EMC Susceptibility Scanning

Speaker: Michael Hopkins

Date: November 18, 2010

Time: 5:30 PM

Location: Fairlane Campus - U of M Dearborn (Map Code FCN)

University of Michigan
School of Management
Fairlane Center
North - Room TBD
19000 Hubbard Drive
Dearborn, MI 48126

Driving Directions

Please pre-register for this free event online at: 



Registration Deadline: 10 AM on the day of the event

Schedule of Events


5:30 – 6:00 Pizza and Refreshments provided by: EQS Systems

Harvey Newell
EQS Systems
Indiana/Michigan Office
(734) 751-2582 


6:00 – 7:00 Presentation

The Chapter Presentation is a FREE event.  IEEE Non-Members Welcome!

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ABSTRACT: ESD/EMC Susceptibility Scanning


As technology evolves, so must the instrumentation we use to evaluate the performance of that new technology. This is true for EMC as well as for all other aspects of product evaluation.  As a result, new technologies are emerging which could revolutionize the way we look at EMC susceptibility. One of these is transient immunity scanning to locate sensitive circuits and devices and another is reconstruction of transient currents using scanning techniques to see just where ESD and other transient currents are going. In the area of ESD, devices are designed and tested to insure they survive during transportation and handling, but systems are tested for their ability to survive and (often) continue to operate in the face of ESD. Devices are tested to determine the level at which they no longer function; systems are tested to insure they are not upset --- a big difference – but we’ll discuss how these new scanning technologies can help close the gap between the two.



Michael Hopkins has nearly 30 years experience with EMC and ESD as an independent consultant, an employee of Thermo Fisher Scientific working with the KeyTek product lines, Amber Precision Instruments, and now as the General Manager of EM Test USA. He has worked closely with manufacturers and laboratories world-wide providing training, applications help, and assistance with the development of interpretation of test standards. He is the author of several papers and articles on ESD and other system level EMC phenomena, and has participated in numerous national and international seminars as author, speaker, and panelist. Michael is an active member of several committees developing standards for industry including the ESD Association, IEC Technical Committees 77A and B for the development and maintenance of Basic EMC standards, IEEE, SAE and ANSI.


Michael Hopkins


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