Meeting Notice

The Southeastern Michigan IEEE EMC Society presents:

“Do’s and Don’ts” in the application of high-power RF amplifiers PDF

Jason H. Smith

ar rf/microwave instrumentation

Date: February 19, 2009

Time: 5:30 PM

Location: Fairlane Campus - U of M Dearborn (Map Code FCN)

University of Michigan
School of Management
Fairlane Center North - Room 120
19000 Hubbard Drive
Dearborn, MI 48126

Driving Directions

Please pre-register for this free event online at:

https://www.ieeeemcs.org/semi/regemcmeet.asp?EventID=021909

Deadline: Noon on the day prior to the event


Schedule of Events

5:30 – 6:00 Pizza and Refreshments provided by:

ar rf/microwave instrumentation

 

6:00 – 7:00 Presentation

 
 
The Chapter Presentation is a FREE event.  IEEE Non-Members Welcome!

To be added or removed from the IEEE EMC e-mailing list, send an email to scott@emcsociety.org with ADD or REMOVE in subject line.

The IEEE Southeastern Michigan EMC Homepage is http://www.emcsociety.org/

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Abstract: “Do’s and Don’ts” in the application of high-power RF amplifiers in EMC test systems.

RF amplifiers are often thought of as simple devices used to increase signal strength. While it is true that fundamentally all amplifiers have at least one input and output and increase the input signal strength to a level required by the specific application, there are a number of factors that must be considered to properly utilize a modern RF amplifier in a test system.

EMC testing applications represent some of the most extreme environments that RF amplifiers are called upon to operate within. Furthermore, RF amplifiers constitute a large portion of the overall cost associated with large EMC test systems. For these reasons it is incumbent for users to fully understand the nuances of proper RF amplifier installation, usage, as well as safety concerns to extend the life of the amplifier and provide the most accurate, repeatable test results.

This presentation provides guidance in the application of high-power RF amplifiers in EMC test systems.

Amplifier Discussion Topics:

                A review of amplifier technologies, highlighting their respective advantages and disadvantages

                The importance of signal input levels

                The significance of the load impedance and the impact on amplifier performance and output power

                The optimum way to monitor and record RF power

                Typical installation concerns

Jason H. Smith

Biography

Jason Smith Graduated with a BS from University of Delaware in 1997 majoring in Engineering Technology. After college he started working for Candes Systems Inc. in Harleysville, PA USA as a computer specialist for TEMPEST computer systems. Promoted to a test engineer position with their sister company Radiation Sciences Inc. and quickly became the EMC Lab manager of their independent EMC test house. He moved on to work for Omega Engineering Inc. as their EMC lab Manager for their Commercial EMC test lab, Analab Llc. Overall Jason has 7 years of EMC testing experience with military, avionics, commercial, medical, telecom, and automotive testing.

Jason joined AR RF/Microwave Instrumentation in February 2004, current position is the Supervisor Application Engineering.   In this position Jason is product applications support to customers, technical training, technical writing, and provides guidance for product development for AR RF/Microwave Instrumentation’s full range of products.  

To be added or removed from the Southeastern Michigan IEEE EMC Society email list, just send an email to scott@emcsociety.org with ADD or REMOVE as the subject line.

The IEEE Southeastern Michigan EMC Homepage is http://www.emcsociety.org