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Meeting Notice

The Southeastern Michigan IEEE EMC Society presents:

Important Characteristics of Digital Oscilloscopes
&
RADAR Pulse Measurements with Digital Oscilloscopes

POWERPOINT SLIDE SHOW LINK (9 MB File)

PDF Version (2.5 MB)

Presented by: Vince Woerdeman and Marty Gubow, Agilent Technologies

Date: Thursday, October 18, 2007

Time: 5:30 PM

Location: Fairlane Campus - U of M Dearborn (Map Code FCN)

University of Michigan
School of Management
Fairlane Center North - Room 120
19000 Hubbard Drive
Dearborn, MI 48126

Driving Directions

Please pre-register for this free event online at: https://www.ieeeemcs.org/semi/regemcmeet.asp?EventID=101807

Registration Deadline: Noon on the day prior to the event.

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Schedule of Events

5:30 – 6:00 Pizza and Refreshments Sponsor: Agilent Technologies

6:00 – 7:00 Technical Presentation

The Chapter Presentation is a FREE event.  IEEE Non-Members Welcome!

To be added or removed from the IEEE EMC e-mailing list, send an email to scott@emcsociety.org with ADD or REMOVE in subject line.

The IEEE Southeastern Michigan EMC Homepage is http://emcsociety.org/

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Important Characteristics of Digital Oscilloscopes

Abstract:

Today’s electronic designs are placing increasing demands on engineers to meet the performance requirements of high-speed circuitry with fast signal rise times. These demands are driving the need for higher-bandwidth oscilloscopes with higher sample rates while maintaining accuracy and low noise. Engineers rely on instruments to preserve the most accurate representation of signals being measured and thereby not allow instrument measurement errors to impact their designs. But sorting through digital oscilloscope performance features and specifications can present significant challenges in evaluating key aspects that could affect signal measurement integrity. This paper explains the relationships between bandwidth, sampling theory, and digital oscilloscope characteristics. It explains certain performance characteristics that are essential to accurately test and verify designs, and points out characteristics that bear diminished return in true oscilloscope performance.

Presenter:

Vince Woerdeman

Agilent Technologies

48679 Alpha Drive, Suite 190

Wixom, MI 48393

USA

Ph: +1 248 735-7564

Email: vwoerdeman@agilent.com

Presenter’s Biography:

Vince Woerdeman is a Field Engineer with Agilent Technologies. He began his career with Hewlett-Packard/Agilent in 1995 as a Systems Engineer, focusing primarily with automotive and other electronic functional test systems. Prior to 1995, Vince was employed by companies such as General Motors, Lockheed-Martin, and Hughes Aircraft. Vince graduated from the University of Detroit with a degree in electrical engineering. In his spare time, he enjoys cycling, traveling, and spending time with his family.

RADAR Pulse Measurements with Digital Oscilloscopes

Abstract:

RADAR signals are comprised of pulsed RF or microwave carriers. Many methods of measuring and characterizing RADAR signals exist, employing spectrum analyzers, oscilloscopes, and signal anayzers. Depending on the goals of your measurement, one type of instrument may hold advantages over the others. This presentation covers various types of RADAR measurement parameters and focuses on the methods, considerations, and advantages of using digital oscilloscopes for RADAR pulse measurements.

Presenter:

Marty Gubow